Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Teaching & Learning Packages Atomic Force Microscopy

Atomic Force Microscopy

This teaching and learning package provides a brief introduction to atomic force microscopy (AFM), some of the ways it is commonly used and some of the problems faced.

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The 3D rendering above shows gallium nitride islands grown on a sapphire substrate, imaged using atomic force microscopy

First created: August 2009. Converted to HTML5 February 2021.