DoITPoMS - TLP Library Atomic Force Microscopy

Atomic Force Microscopy

This teaching and learning package provides a brief introduction to atomic force microscopy (AFM), some of the ways it is commonly used and some of the problems faced.

	Aims Before you start Introduction Tip Surface Interaction Modes of Operation The Scanner Tip and Cantilever Feedback Scanner Related Artefacts Tip Related Artefacts Other Artefacts Summary Questions Going further
The 3D rendering above shows gallium nitride islands grown on a sapphire substrate, imaged using atomic force microscopy
You can also view and download the animations from this TLP at CORE-Materials

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First created: August 2009.