Electromigration
AimsBefore you startIntroductionThe theory of electromigrationElectromigration damageFlux divergence (I)Flux divergence (II)Avoiding electromigration problemsAlternatives to aluminium metallizationSummaryQuestionsGoing furtherTLP creditsTLP contentsShow all contentViewing and downloading resourcesAbout the TLPsTerms of useFeedbackCredits Print this page
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Going further
Books and Papers:
- Reliability and Failure of Electronic Materials and Devices by Milton Ohring, Academic Press, San Diego, 1998.
Provides a good overall explanation on the topic of electromigration
- Review Article: Electromigration in integrated circuit conductors by J R Lloyd (J. Phys. D: Appl. Phys. 32 (1999) R109-R118).
A good summary on electromigration in integrated circuit conductors
- VLSI Technology by S.M. Sze (editor), Mc-Graw-Hill Book Company, New Jersey, 1988.
Contains a good section on metallization and its choice of use for different materials
Website:
It contains a nice simple description of the electromigration process. Several other searches can be made within Wikipedia, the free encyclopedia, to look up technical terms.