Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Categories > Device > Miscellaneous > Focused ion beam (FIB) secondary electron image

5 keywords available. The number of micrographs available is given in [brackets].

cross section [4]
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device [5]
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integrated circuit [5] Link to MATTER Glossary entry
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passivated [1] Link to MATTER Glossary entry
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surface [1]
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