Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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51 micrographs for category Composite:

Showing 11 - 20 of 51 micrographs Page 1 2 3 4 5 6 | Previous | Next
Link to full record for micrograph 176 Micrograph 176 : Concrete from a commercial paving slab
System: Concrete, Composition: Aggregate, cement, water
Reflected light microscopy
250 μm
Link to full record for micrograph 193 Micrograph 193 : MgO-C Refractory Brick
System: MgO-C, Composition: MgO 50-90, C 8-37 (wt%), remainder Al, Si metal addition
Reflected light microscopy
200 μm
Link to full record for micrograph 194 Micrograph 194 : MgO-C Refractory Brick
System: MgO-C, Composition: MgO 50-90, C 8-37 (wt%), remainder Al, Si metal addition
Reflected light microscopy
200 μm
Link to full record for micrograph 195 Micrograph 195 : Zirconia Toughened Alumina (ZTA)
System: ZrO2-Al2O3, Composition: ZrO2 5-30, Al2O3 70-95 (wt%)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 546 Micrograph 546 : Delamination cracks seen in h-BN particles subjected to compressive stress in the (0001) planes (within a silicon nitride particulate-reinforced silicon carbide composite)
System: Si3N4-SiC composite, Composition: Not specified
High resolution electron microscopy (HREM)
10 nm
Link to full record for micrograph 547 Micrograph 547 : h-BN inclusion (precipitate) in a b-Si3N4 grain (within a silicon nitride particulate-reinforced silicon carbide composite)
System: Si3N4-SiC composite, Composition: Not specified
High resolution electron microscopy (HREM)
20 nm
Link to full record for micrograph 549 Micrograph 549 : Misoriented interphase boundary between h-BN (precipitate) and SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite)
System: Si3N4-SiC composite, Composition: Not specified
High resolution electron microscopy (HREM)
1.2 nm
Link to full record for micrograph 551 Micrograph 551 : A regularly stepped interface boundary between h-BN (precipitate) and Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite)
System: Si3N4-SiC composite, Composition: Not specified
High resolution electron microscopy (HREM)
10 nm
Link to full record for micrograph 552 Micrograph 552 : An amorphous phase trapped at a triple junction between Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite).
System: Si3N4-SiC composite, Composition: Not specified
High resolution electron microscopy (HREM)
20 nm
Link to full record for micrograph 553 Micrograph 553 : Image of part of a crystalline triple junction between SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite)
System: Si3N4-SiC composite, Composition: Not specified
High resolution electron microscopy (HREM)
6 nm
Showing 11 - 20 of 51 micrographs Page 1 2 3 4 5 6 | Previous | Next

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