Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

Keyword

86 micrographs for keyword tin, ordered by micrograph number.


Showing 71 - 80 of 86 micrographs Page 1 .. 3 4 5 6 7 8 9 | Previous | Next

Link to full record for micrograph 755 Micrograph 755 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 756 Micrograph 756 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 757 Micrograph 757 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 758 Micrograph 758 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 759 Micrograph 759 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 760 Micrograph 760 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 761 Micrograph 761 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 762 Micrograph 762 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 763 Micrograph 763 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 764 Micrograph 764 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm

Showing 71 - 80 of 86 micrographs Page 1 .. 3 4 5 6 7 8 9 | Previous | Next

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