Keyword
86 micrographs for keyword tin, ordered by micrograph number.
Showing 71 - 80 of 86 micrographs | Page 1 .. 3 4 5 6 7 8 9 | Previous | Next |
Micrograph
755
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Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
756
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
757
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
758
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
759
:
Bi 60, Sn 40 (wt%) System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
760
:
Bi 60, Sn 40 (wt%) System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
761
:
Bi 60, Sn 40 (wt%) System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
762
:
Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
763
:
Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
764
:
Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
Showing 71 - 80 of 86 micrographs | Page 1 .. 3 4 5 6 7 8 9 | Previous | Next |