Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Technique

14 micrographs for technique Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode, ordered by micrograph number.

Showing 1 - 10 of 14 micrographs Page 1 2 | Previous | Next
Link to full record for micrograph 189 Micrograph 189 : Titanate ceramic for immobilising radioactive waste
System: Oxides + simulated fission products, Composition: Not specified
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
30 μm
Link to full record for micrograph 191 Micrograph 191 : Dolomite (Ca,Mg)(CO3)2
System: CaCO3-MgCO3, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
30 μm
Link to full record for micrograph 192 Micrograph 192 : Doloma, (Ca,Mg)O
System: (Ca,Mg)O, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
30 μm
Link to full record for micrograph 195 Micrograph 195 : Zirconia Toughened Alumina (ZTA)
System: ZrO2-Al2O3, Composition: ZrO2 5-30, Al2O3 70-95 (wt%)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 624 Micrograph 624 : Inter-particle bond in the fire-resistant composite Barrikade (R)
System: Barrikade, Composition: Expanded vermiculite, cured in ZnO and mixed with binder
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
100 μm
Link to full record for micrograph 724 Micrograph 724 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 725 Micrograph 725 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 726 Micrograph 726 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 728 Micrograph 728 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 729 Micrograph 729 : Ni-Superalloy, exposed microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Showing 1 - 10 of 14 micrographs Page 1 2 | Previous | Next

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