Technique
14 micrographs for technique Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode, ordered by micrograph number.
Showing 1 - 10 of 14 micrographs | Page 1 2 | Previous | Next |
Micrograph
189
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Titanate ceramic for immobilising radioactive waste System: Oxides + simulated fission products, Composition: Not specified Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
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Micrograph
191
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Dolomite (Ca,Mg)(CO3)2 System: CaCO3-MgCO3, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
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Micrograph
192
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Doloma, (Ca,Mg)O System: (Ca,Mg)O, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
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Micrograph
195
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Zirconia Toughened Alumina (ZTA) System: ZrO2-Al2O3, Composition: ZrO2 5-30, Al2O3 70-95 (wt%) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
624
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Inter-particle bond in the fire-resistant composite Barrikade (R) System: Barrikade, Composition: Expanded vermiculite, cured in ZnO and mixed with binder Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 100 μm |
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Micrograph
724
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Ni-Superalloy, as-extruded microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
725
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Ni-Superalloy, as-extruded microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
726
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Ni-Superalloy, heat treated above gamma-prime solvus System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
728
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Ni-Superalloy, heat treated above gamma-prime solvus System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
729
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Ni-Superalloy, exposed microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
Showing 1 - 10 of 14 micrographs | Page 1 2 | Previous | Next |