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AFM operating modes
AFM operating modes
AFM operating modes
Atomic force microscopes can operate in a number of
modes.
The three main ones are:
The three main ones are:
contact
tapping
non-contact
force
modulation
modulation
ultrasonic
pulsed
force
force
static
deflection
deflection
AFM operating modes
Click on one of the main modes or restart.
contact
tapping
non-contact
Contact
In contact mode the cantilever is static and the tip
touches the sample (possibly through the fluid layer adsorbed on the
surface).
Contact
The cantilever may deflect in two ways:
Vertical deflection is used to measure normal forces
Torsional motion is used
to measure lateral forces
to measure lateral forces
Contact
Normal contact mode is a simple way to measure topography.
The deflection amplitude of the cantilever is monitored by reflecting a laser beam off it.
The deflection amplitude of the cantilever is monitored by reflecting a laser beam off it.
Tapping mode
In tapping mode the cantilever is oscillated close to
its resonant frequency.
Non-contact mode
In non-contact mode the cantilever oscillates at just
above the resonant frequency.