Atomic Force Microscopy
AimsBefore you startIntroductionTip Surface InteractionModes of OperationThe ScannerTip and CantileverFeedbackScanner Related ArtefactsTip Related ArtefactsOther ArtefactsSummaryQuestionsGoing furtherTLP creditsTLP contentsShow all contentViewing and downloading resourcesAbout the TLPsTerms of useFeedbackCredits Print this page
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Aims
On completion of this TLP you should:
- Understand the basic principles of atomic force microscopy (AFM), including the different modes it can be used in.
- Understand how AFM can be used in materials science.
- Be aware of some of the problems that can be encountered, and how to overcome them.