Atomic Force Microscopy
AimsBefore you startIntroductionTip Surface InteractionModes of OperationThe ScannerTip and CantileverFeedbackScanner Related ArtefactsTip Related ArtefactsOther ArtefactsSummaryQuestionsGoing furtherTLP creditsTLP contentsShow all contentViewing and downloading resourcesAbout the TLPsTerms of useFeedbackCredits Print this page
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Going further
Books
- Meyer, Hug and Bennewitz, Scanning Probe Microscopy: The Lab on a Tip, Springer, 2003
Websites
- A guide to the principles and techniques of AFM and other SPM methods, SPM Principles (NT-MDT) including animations
- A Guide to AFM Image Artifacts (Pacific Nanotechnology)]
- Atomic Force Microscopy (nanoHUB.org)] – a presentation/podcast introducing AFM