Normally this is achieved by using a four-circle diffractometer or Eulerian Cradle.

Texture is measured using x-ray diffraction by systematically changing the angular orientation of the sample and measuring the diffraction peaks.

Roll over the image to find out about the different components

2θ

The intensity of the Bragg peak measured at 2θ varies as a function of χ and φ. Intensity data is collected for all φ values for a given setting of χ. The χ value is then changed and the process is repeated

The value of 2θ is kept constant so that the intensity of a specific reflection can be measured

For measurement of reflected x-rays, ω is equal to zero

Stage 1

Rotate the sample about φ;

φ can take any value up to 360°.

Stage 2

Rotate the sample around the frame of the cradle by χ

Stage 3

The sample is systematically rotated through φ at all values of χ

The intensity of 2θ at all sample orientations can be measured in this way

These systematic measurements can be used to produce a plot of the reflection intensity as a function of angular orientation of the specimen

The data can be represented graphically in the form of pole figures, inverse pole figures or orientation distribution functions (ODF)