Teaching and learning packages (TLPs) are self-contained, interactive resources, each focusing on one area of Materials Science.
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It is common in basic analysis to treat bulk materials as isotropic - their properties are independent of the direction in which they are measured. However the atomic scale structure can result in properties that vary with direction. This teaching and learning package (TLP) looks into typical examples of such anisotropy and gives a brief mathematical look into modelling the behaviour.
Provides a brief introduction to atomic force microscopy (AFM), some of the ways it is commonly used and some of the problems faced.
This teaching and learning package provides an introduction to crystalline, polycrystalline and amorphous solids, and how the atomic-level structure has radical consequences for some of the properties of the material. It introduces the use of polarised light to examine the optical properties of materials, and shows how a variety of simple models can be used to visualise important features of the microstructure of materials.
This teaching and learning package provides an introduction to Brillouin zones in two and three dimensions and is aimed at developing familiarity with Brillouin Zones. It will not cover any specific applications. Brillouin Zones are particularly useful in understanding the electronic and thermal properties of crystalline solids.
Creep is a major concern, since it can cause materials to progressively deform, and possibly to fail, under applied stresses below their yield stress. This is particularly likely at elevated temperatures. In this package, the main mechanisms of creep are outlined and some analytical expressions presented that are used to represent its progression. Testing procedures are described, covering both simple uniaxial loading and more complex test geometries. It is shown how creep characteristics can be inferred from the outcome of such tests, requiring in some cases numerical (finite element) modelling of the process. Information is also presented about the design of highly creep-resistant materials.
This teaching and learning package (TLP) introduces the concept of texture in crystalline materials such as common metals and metallic alloys.
Crystalline materials are characterised by a regular atomic structure that repeats itself in all three dimensions. In other words the structure displays translational symmetry.
This teaching and learning package (TLP) uses an atomistic model of the misfit energy to predict dislocation width and Peierls stress.
Dislocations are crucially important in determining the mechanical behaviour of materials. This teaching and learning package provides an introduction to dislocations and their motion through a crystal. A 'bubble raft' model is used to demonstrate some of the features of dislocations and other lattice defects. Some methods for observing real dislocations in materials are examined.
This TLP enables you to explore the way in which perfect thin crystalline layers are deposited epitaxially (i.e. in the same crystal orientation) on semiconductor substrates. This is the way many electronic and opto-electronic devices are now fabricated using techniques such as molecular beam epitaxy (MBE).
This teaching and learning package (TLP) is an introduction to the finite element method. It covers basic concepts including meshes, nodes, degrees of freedom and boundary conditions. The direct stiffness method is also introduced, as is the global stiffness matrix and interpolation functions. The basic steps in constructing a finite element model are also covered.
This teaching and learning package provides an introduction to the method used to describe planes of atoms in a crystalline material. The practical uses of describing planes of atoms are also addressed.
This teaching and learning package (TLP) introduces the basic mechanics involved in mechanical testing of metals, first outlining the meaning of deviatoric and hydrostatic stresses and strains, followed by definitions of true and nominal values and then covering the idea of constitutive laws that characterise the development of plastic deformation. The issues involved in carrying out conventional uniaxial (tensile and compressive) tests, and interpreting experimental outcomes, are then described. Finally, hardness testing is explained, followed by the development of a related technique involving indentation testing that allows full stress-strain curves to be obtained. All of the analyses are based on a continuum treatment of plastic deformation, with extensive numerical modelling, using the Finite Element Method (FEM).
This teaching and learning package is an introduction to the basic concepts of polymer science. It includes molecular structure, synthesis and tests for identification.
An introduction to the analysis of materials and chemicals by the Raman scattering of light.
This TLP shows the construction of reciprocal lattices from real ones, use of the Ewald sphere for diffraction experiments and some other applications of reciprocal space.
This teaching and learning package provides a very basic introduction to semiconductors. These materials are essential to the operation of solid state electronic devices.
This teaching and learning package explains how plastic deformation of materials occurs through the mechanism of slip. Slip involves dislocation glide on particular slip planes. The geometry of slip is explained, and electron microscopy techniques are used to show slip occurring in single crystals of cadmium.
This teaching and learning package is based on a practical used within the Department of Materials Science and Metallurgy at the University of Cambridge. The package is aimed at first year undergraduate Materials Science students and focuses on the different types of solid solution and the thermodynamic principles involved in understanding them.
This TLP covers the use of the Stereographic projection and Wulff nets.
Transmission electron microscopy is a very important tool in materials science for investigating the fine-scale structure of materials. This TLP serves as an introduction to the basic concepts and structure of the transmission electron microscope.
This teaching & learning package provides an introduction to X-ray diffraction. It describes the main crystallographic information that can be obtained and experimental methods most commonly used.