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Contributor
18 micrographs contributed by Prof W E Lee, ordered by micrograph number.
| Showing 11 - 18 of 18 micrographs | Page 1 2 | Previous | Next |
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Micrograph
192
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Doloma, (Ca,Mg)O System: (Ca,Mg)O, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
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Micrograph
193
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MgO-C Refractory Brick System: MgO-C, Composition: MgO 50-90, C 8-37 (wt%), remainder Al, Si metal addition Reflected light microscopy 200 μm |
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Micrograph
194
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MgO-C Refractory Brick System: MgO-C, Composition: MgO 50-90, C 8-37 (wt%), remainder Al, Si metal addition Reflected light microscopy 200 μm |
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Micrograph
195
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Zirconia Toughened Alumina (ZTA) System: ZrO2-Al2O3, Composition: ZrO2 5-30, Al2O3 70-95 (wt%) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
196
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Tetragonal Zirconia Polycrystals (TZP) System: ZrO2-Y2O3, Composition: Y2O3 2-3, ZrO2 96-97 (wt%) Bright-field TEM 600 nm |
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Micrograph
197
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Partially Stabilised Zirconia (PSZ) System: ZrO2-MgO, Composition: MgO 2.5-3.6, ZrO2 97.5-96.4 (wt%) Bright-field TEM 300 nm |
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Micrograph
198
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96% Alumina System: Al2O3, Composition: Al2O3 96%, remainder MgO, CaO, SiO2 Reflected light microscopy 250 μm |
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Micrograph
199
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BaTiO3 Temperature-stable dielectric capacitor System: BaTiO3 + other oxides such as Nb2O5, Bi2O3, Composition: BaTiO3 95-97 (wt%) Bright-field TEM 1 μm |
| Showing 11 - 18 of 18 micrographs | Page 1 2 | Previous | Next |