Contributor
7 micrographs contributed by Lewis Lea, ordered by micrograph number.
Micrograph
854
:
Low Carbon Steel Grains, Copper Edge System: Fe-C-X, Composition: Fe, C low (wt%) Reflected light microscopy 500 μm |
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Micrograph
855
:
Low Carbon Steel System: Fe-C-X, Composition: Fe, C low (wt%) Scanning electron microscopy (SEM) 20 μm |
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Micrograph
856
:
Low Carbon Steel System: Fe-C-X, Composition: Fe, C low (wt%) Scanning electron microscopy (SEM) 5 μm |
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Micrograph
858
:
Bi 40wt%, Sn 60wt% System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Reflected light microscopy 100 μm |
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Micrograph
859
:
Bi 60wt%, Sn 40wt% System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Reflected light microscopy 100 μm |
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Micrograph
860
:
Bi 80wt%, Sn 20wt% System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Reflected light microscopy 100 μm |
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Micrograph
871
:
Low Carbon Steel System: Fe-C-X, Composition: Fe, C 0.9 (wt%) Atomic force microscopy (AFM) 30 μm |