Keyword
5 micrographs for keyword integrated circuit, ordered by micrograph number.
 |
Micrograph
124
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 20 μm |
 |
Micrograph
125
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 2 μm |
 |
Micrograph
126
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 15 μm |
 |
Micrograph
127
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 40 μm |
 |
Micrograph
128
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 4 μm |
© 2004-2013 University of Cambridge.