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Keyword
31 micrographs for keyword bismuth, ordered by micrograph number.
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Showing 1 - 10 of 31 micrographs
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Micrograph
6
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Bi 60, Cd 40 (wt%), eutectic alloy
System:
Bi-Cd,
Composition:
Bi 60, Cd 40 (wt%)
Reflected light microscopy
200 μm |
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Micrograph
7
:
Bi 60, Cd 40 (wt%), eutectic alloy
System:
Bi-Cd,
Composition:
Bi 60, Cd 40 (wt%)
Reflected light microscopy
40 μm |
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Micrograph
8
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Bi 80, Cd 20 (wt%), hypereutectic alloy
System:
Bi-Cd,
Composition:
Bi 80, Cd 20 (wt%)
Reflected light microscopy
400 μm |
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Micrograph
9
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Bi 80, Cd 20 (wt%), hypereutectic alloy
System:
Bi-Cd,
Composition:
Bi 80, Cd 20 (wt%)
Reflected light microscopy
80 μm |
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Micrograph
744
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Bi 10, Sn 90 (wt%)
System:
Bi-Sn,
Composition:
Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm |
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Micrograph
745
:
Bi 10, Sn 90 (wt%)
System:
Bi-Sn,
Composition:
Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm |
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Micrograph
746
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Bi 10, Sn 90 (wt%)
System:
Bi-Sn,
Composition:
Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm |
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Micrograph
747
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Bi 20, Sn 80 (wt%)
System:
Bi-Sn,
Composition:
Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm |
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Micrograph
748
:
Bi 20, Sn 80 (wt%)
System:
Bi-Sn,
Composition:
Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm |
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Micrograph
749
:
Bi 20, Sn 80 (wt%)
System:
Bi-Sn,
Composition:
Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm |
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Showing 1 - 10 of 31 micrographs
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