Texture describes the orientation distribution of crystals within a polycrystalline aggregate. This can be measured using x-ray diffraction, EBSD, and neutron diffraction and represented in the form of pole diagrams, inverse pole diagrams, and crystal orientation distribution functions.
Texture can arise from processes such as solidification, mechanical deformation, annealing, and in thin films. The presence of texture may be problematic, but if the textures present and their effects are understood, then it can be exploited to great benefit.
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