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Categories > Metal or alloy > Bi 30, Sn 70 (wt%) > Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode > Keyword: tin
3 micrographs available, ordered by micrograph number.
Micrograph
750
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
751
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
|
Micrograph
752
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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