Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Browse the Library
Micrograph Library Browse the libraryAdvanced searchSystemsCompositionsTechniquesKeywordsPhase diagrams
HelpPreferencesAbout the micrograph libraryTerms of useContribute micrographs!FeedbackLinksCredits Print this page
micrograph index montage

Browse the Library

Categories > Metal or alloy > Bi 40, Sn 60 (wt%) > Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode

3 micrographs available, ordered by micrograph number.

Link to full record for micrograph 753 Micrograph 753 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 754 Micrograph 754 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 755 Micrograph 755 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm

Help is available on browsing.

Alternatively, search the Library (from top right on any page), or use advanced search.