Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Categories > Metal or alloy

708 micrographs available, ordered by micrograph number.

Showing 491 - 500 of 708 micrographs Page 1 .. 47 48 49 50 51 52 53 .. 71 | Previous | Next
Link to full record for micrograph 737 Micrograph 737 : Dual-phase steel water quenched from 800°C
System: Fe-C-X, Composition: Fe, C 0.15, Mn 1.5, Si 1.5 (wt%)
Reflected light microscopy
6 μm
Link to full record for micrograph 738 Micrograph 738 : A medium carbon low alloyed structural steel
System: Fe-C-X, Composition: Fe, C medium (wt%), with small alloy addition
Reflected light microscopy
20 μm
Link to full record for micrograph 739 Micrograph 739 : TRIP steel annealed at 775°C for 5 mins and then hold at 400°C for 150s for austenite stabilization
System: Fe-C-X, Composition: Fe, C 0.15, Mn 1.5, Si 1.5 (wt%)
Reflected light microscopy
6 μm
Link to full record for micrograph 740 Micrograph 740 : TRIP steel annealed at 775°C for 5 mins and then hold at 400°C for 40s for austenite stabilization
System: Fe-C-X, Composition: Fe, C 0.15, Mn 1.5, Si 1.5 (wt%)
Reflected light microscopy
20 μm
Link to full record for micrograph 744 Micrograph 744 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 745 Micrograph 745 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 746 Micrograph 746 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 747 Micrograph 747 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 748 Micrograph 748 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 749 Micrograph 749 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Showing 491 - 500 of 708 micrographs Page 1 .. 47 48 49 50 51 52 53 .. 71 | Previous | Next

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