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Categories > Ceramic > Si3N4-SiC composite > High resolution electron microscopy (HREM) > Keyword: ceramic
6 micrographs available, ordered by micrograph number.
Micrograph
546
:
Delamination cracks seen in h-BN particles subjected to compressive stress in the (0001) planes (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 10 nm |
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Micrograph
547
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h-BN inclusion (precipitate) in a b-Si3N4 grain (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 20 nm |
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Micrograph
549
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Misoriented interphase boundary between h-BN (precipitate) and SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 1.2 nm |
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Micrograph
551
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A regularly stepped interface boundary between h-BN (precipitate) and Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 10 nm |
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Micrograph
552
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An amorphous phase trapped at a triple junction between Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite). System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 20 nm |
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Micrograph
553
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Image of part of a crystalline triple junction between SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 6 nm |
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