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Composition
8 micrographs for composition Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al, ordered by micrograph number.
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Micrograph
713
:
IN718 nickel-based superalloy held for 1 minute at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 20 μm |
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Micrograph
714
:
IN718 nickel-based superalloy held for 20 minutes at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 20 μm |
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Micrograph
715
:
IN718 nickel-based superalloy held for 1 hour at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |
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Micrograph
716
:
IN718 nickel-based superalloy held for 3 hours at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |
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Micrograph
717
:
IN718 nickel-based superalloy held for 6 hours at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |
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Micrograph
718
:
IN718 nickel-based superalloy held for 24 hours at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |
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Micrograph
719
:
IN718 nickel-based superalloy held for 48 hours at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |
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Micrograph
720
:
IN718 nickel-based superalloy held for 72 hours at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |