Micrograph Library
Browse the libraryAdvanced searchSystemsCompositionsTechniquesKeywordsPhase diagramsHelpPreferencesAbout the micrograph libraryTerms of useContribute micrographs!FeedbackLinksCredits Print this page

Keyword
58 micrographs for keyword composite material, ordered by micrograph number.
Showing 11 - 20 of 58 micrographs | Page 1 2 3 4 5 6 | Previous | Next |
![]() |
Micrograph
194
:
MgO-C Refractory Brick System: MgO-C, Composition: MgO 50-90, C 8-37 (wt%), remainder Al, Si metal addition Reflected light microscopy 200 μm |
![]() |
Micrograph
195
:
Zirconia Toughened Alumina (ZTA) System: ZrO2-Al2O3, Composition: ZrO2 5-30, Al2O3 70-95 (wt%) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
![]() |
Micrograph
546
:
Delamination cracks seen in h-BN particles subjected to compressive stress in the (0001) planes (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 10 nm |
![]() |
Micrograph
547
:
h-BN inclusion (precipitate) in a b-Si3N4 grain (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 20 nm |
![]() |
Micrograph
549
:
Misoriented interphase boundary between h-BN (precipitate) and SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 1.2 nm |
![]() |
Micrograph
551
:
A regularly stepped interface boundary between h-BN (precipitate) and Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 10 nm |
![]() |
Micrograph
552
:
An amorphous phase trapped at a triple junction between Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite). System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 20 nm |
![]() |
Micrograph
553
:
Image of part of a crystalline triple junction between SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 6 nm |
![]() |
Micrograph
557
:
High Impact Polystyrene (HIPS) System: High Impact Polystyrene (HIPS), Composition: PS - 15%PB Transmitted light microscopy 10 μm |
![]() |
Micrograph
558
:
High Impact Polystyrene (HIPS) System: High Impact Polystyrene (HIPS), Composition: PS - 35%PB Transmitted light microscopy 20 μm |
Showing 11 - 20 of 58 micrographs | Page 1 2 3 4 5 6 | Previous | Next |