DoITPoMS

Keyword

2 micrographs for keyword creep, ordered by micrograph number.


Link to full record for micrograph 722 Micrograph 722 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
6 μm
Link to full record for micrograph 723 Micrograph 723 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Transmission electron microscopy (TEM)
200 nm

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