DoITPoMS

Keyword

86 micrographs for keyword tin, ordered by micrograph number.


Showing 61 - 70 of 86 micrographs Page 1 .. 3 4 5 6 7 8 9 | Previous | Next

Link to full record for micrograph 745 Micrograph 745 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 746 Micrograph 746 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 747 Micrograph 747 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 748 Micrograph 748 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 749 Micrograph 749 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 750 Micrograph 750 : Bi 30, Sn 70 (wt%)
System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 751 Micrograph 751 : Bi 30, Sn 70 (wt%)
System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 752 Micrograph 752 : Bi 30, Sn 70 (wt%)
System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 753 Micrograph 753 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 754 Micrograph 754 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm

Showing 61 - 70 of 86 micrographs Page 1 .. 3 4 5 6 7 8 9 | Previous | Next

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