Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Categories > Metal or alloy > Keyword: bismuth

31 micrographs available, ordered by micrograph number.

Showing 1 - 10 of 31 micrographs Page 1 2 3 4 | Previous | Next
Link to full record for micrograph 6 Micrograph 6 : Bi 60, Cd 40 (wt%), eutectic alloy
System: Bi-Cd, Composition: Bi 60, Cd 40 (wt%)
Reflected light microscopy
200 μm
Link to full record for micrograph 7 Micrograph 7 : Bi 60, Cd 40 (wt%), eutectic alloy
System: Bi-Cd, Composition: Bi 60, Cd 40 (wt%)
Reflected light microscopy
40 μm
Link to full record for micrograph 8 Micrograph 8 : Bi 80, Cd 20 (wt%), hypereutectic alloy
System: Bi-Cd, Composition: Bi 80, Cd 20 (wt%)
Reflected light microscopy
400 μm
Link to full record for micrograph 9 Micrograph 9 : Bi 80, Cd 20 (wt%), hypereutectic alloy
System: Bi-Cd, Composition: Bi 80, Cd 20 (wt%)
Reflected light microscopy
80 μm
Link to full record for micrograph 744 Micrograph 744 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 745 Micrograph 745 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 746 Micrograph 746 : Bi 10, Sn 90 (wt%)
System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 747 Micrograph 747 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 748 Micrograph 748 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 749 Micrograph 749 : Bi 20, Sn 80 (wt%)
System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Showing 1 - 10 of 31 micrographs Page 1 2 3 4 | Previous | Next

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