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Categories > Metal or alloy > Keyword: bismuth
31 micrographs available, ordered by micrograph number.
Showing 11 - 20 of 31 micrographs | Page 1 2 3 4 | Previous | Next |
Micrograph
750
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
751
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
752
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
753
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
754
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
755
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
756
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
757
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
758
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
759
:
Bi 60, Sn 40 (wt%) System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
Showing 11 - 20 of 31 micrographs | Page 1 2 3 4 | Previous | Next |
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