Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Categories > Device > Keyword: surface

1 micrograph available, ordered by micrograph number.

Link to full record for micrograph 127 Micrograph 127 : CMOS integrated circuit with Al wiring
System: Miscellaneous, Composition: Not specified
Focused ion beam (FIB) secondary electron image
40 μm

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