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Categories > Ceramic
92 micrographs available, ordered by micrograph number.
Showing 31 - 40 of 92 micrographs | Page 1 2 3 4 5 6 7 .. 10 | Previous | Next |
Micrograph
183
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Oven-to-tableware System: Miscellaneous, Composition: Not specified Transmitted polarised light microscopy 250 μm |
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Micrograph
184
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Oven-to-tableware System: Miscellaneous, Composition: Not specified Transmitted polarised light microscopy 250 μm |
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Micrograph
185
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Silicon Nitride-bonded Silicon Carbide System: Silicon nitride-bonded silicon carbide, Composition: Particles of SiC in a reaction-bonded Si3N4 matrix Reflected light microscopy 250 μm |
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Micrograph
186
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Silicon Carbide from within a Silicon Nitride-bonded Silicon Carbide sample System: Silicon nitride-bonded silicon carbide, Composition: Particles of SiC in a reaction-bonded Si3N4 matrix Reflected light microscopy 25 μm |
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Micrograph
187
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Part of a Denby pottery mug, showing the glaze on the surface System: Al2O3-SiO2, Composition: Mostly clay (which consists of alumina and silica) Reflected light microscopy 200 μm |
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Micrograph
188
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Part of a Denby pottery mug System: Al2O3-SiO2, Composition: Mostly clay (which consists of alumina and silica) Reflected light microscopy 200 μm |
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Micrograph
189
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Titanate ceramic for immobilising radioactive waste System: Oxides + simulated fission products, Composition: Not specified Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
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Micrograph
190
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Aluminous Electrical Porcelain System: Triaxial (i.e. clay/flux/filler) porcelain, Composition: Ball clay 30 , china clay 10, potash feldspar 20, silica sand 20, calcined alumina 20 (wt%) Scanning electron microscopy (SEM) 10 μm |
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Micrograph
191
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Dolomite (Ca,Mg)(CO3)2 System: CaCO3-MgCO3, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
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Micrograph
192
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Doloma, (Ca,Mg)O System: (Ca,Mg)O, Composition: CaO 57, MgO 41 (wt%), + Fe2O3, SiO2 and Al2O3 (typical) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 30 μm |
Showing 31 - 40 of 92 micrographs | Page 1 2 3 4 5 6 7 .. 10 | Previous | Next |
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