Category
708 micrographs for category Metal or alloy:
Showing 501 - 510 of 708 micrographs | Page 1 .. 48 49 50 51 52 53 54 .. 71 | Previous | Next |
Micrograph
750
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Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
751
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
752
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
753
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Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
754
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
755
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
756
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Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
757
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Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
758
:
Bi 50, Sn 50 (wt%) System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
759
:
Bi 60, Sn 40 (wt%) System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
Showing 501 - 510 of 708 micrographs | Page 1 .. 48 49 50 51 52 53 54 .. 71 | Previous | Next |