Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Composition
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Composition

4 micrographs for composition Bi 80, Sn 20 (wt%), ordered by micrograph number.

Link to full record for micrograph 765 Micrograph 765 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 766 Micrograph 766 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 767 Micrograph 767 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 860 Micrograph 860 : Bi 80wt%, Sn 20wt%
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Reflected light microscopy
100 μm

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