Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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27 micrographs contributed by M Charles and A Cockburn, ordered by micrograph number.

Showing 21 - 27 of 27 micrographs Page 1 2 3 | Previous | Next
Link to full record for micrograph 764 Micrograph 764 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 765 Micrograph 765 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 766 Micrograph 766 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 767 Micrograph 767 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 768 Micrograph 768 : Bi 90, Sn 10 (wt%)
System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 769 Micrograph 769 : Bi 90, Sn 10 (wt%)
System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 770 Micrograph 770 : Bi 90, Sn 10 (wt%)
System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Showing 21 - 27 of 27 micrographs Page 1 2 3 | Previous | Next

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