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Keyword

34 micrographs for keyword nickel, ordered by micrograph number.

Showing 21 - 30 of 34 micrographs Page 1 2 3 4 | Previous | Next
Link to full record for micrograph 719 Micrograph 719 : IN718 nickel-based superalloy held for 48 hours at 850°C
System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al
Reflected light microscopy, cross-polarised, with Nomarski filter
25 μm
Link to full record for micrograph 720 Micrograph 720 : IN718 nickel-based superalloy held for 72 hours at 850°C
System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al
Reflected light microscopy, cross-polarised, with Nomarski filter
25 μm
Link to full record for micrograph 721 Micrograph 721 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 722 Micrograph 722 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
6 μm
Link to full record for micrograph 723 Micrograph 723 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Transmission electron microscopy (TEM)
200 nm
Link to full record for micrograph 724 Micrograph 724 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 725 Micrograph 725 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 726 Micrograph 726 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 727 Micrograph 727 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
100 nm
Link to full record for micrograph 728 Micrograph 728 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Showing 21 - 30 of 34 micrographs Page 1 2 3 4 | Previous | Next

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