Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Keyword

31 micrographs for keyword bismuth, ordered by micrograph number.

Showing 11 - 20 of 31 micrographs Page 1 2 3 4 | Previous | Next
Link to full record for micrograph 750 Micrograph 750 : Bi 30, Sn 70 (wt%)
System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 751 Micrograph 751 : Bi 30, Sn 70 (wt%)
System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 752 Micrograph 752 : Bi 30, Sn 70 (wt%)
System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 753 Micrograph 753 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 754 Micrograph 754 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 755 Micrograph 755 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 756 Micrograph 756 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 757 Micrograph 757 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 758 Micrograph 758 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 759 Micrograph 759 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Showing 11 - 20 of 31 micrographs Page 1 2 3 4 | Previous | Next

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