Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

Keyword

31 micrographs for keyword bismuth, ordered by micrograph number.


Showing 21 - 30 of 31 micrographs Page 1 2 3 4 | Previous | Next

Link to full record for micrograph 760 Micrograph 760 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 761 Micrograph 761 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 762 Micrograph 762 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 763 Micrograph 763 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 764 Micrograph 764 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 765 Micrograph 765 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 766 Micrograph 766 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 767 Micrograph 767 : Bi 80, Sn 20 (wt%)
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 768 Micrograph 768 : Bi 90, Sn 10 (wt%)
System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 769 Micrograph 769 : Bi 90, Sn 10 (wt%)
System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm

Showing 21 - 30 of 31 micrographs Page 1 2 3 4 | Previous | Next

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