Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Technique
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Technique

27 micrographs for technique Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode, ordered by micrograph number.

Showing 11 - 20 of 27 micrographs Page 1 2 3 | Previous | Next
Link to full record for micrograph 754 Micrograph 754 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 755 Micrograph 755 : Bi 40, Sn 60 (wt%)
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 756 Micrograph 756 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 757 Micrograph 757 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 758 Micrograph 758 : Bi 50, Sn 50 (wt%)
System: Bi-Sn, Composition: Bi 50, Sn 50 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 759 Micrograph 759 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 760 Micrograph 760 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 761 Micrograph 761 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 762 Micrograph 762 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 763 Micrograph 763 : Bi 70, Sn 30 (wt%)
System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Showing 11 - 20 of 27 micrographs Page 1 2 3 | Previous | Next

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