DoITPoMS

Composition

7 micrographs for composition Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy), ordered by micrograph number.

Link to full record for micrograph 724 Micrograph 724 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 725 Micrograph 725 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 726 Micrograph 726 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 727 Micrograph 727 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
100 nm
Link to full record for micrograph 728 Micrograph 728 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 729 Micrograph 729 : Ni-Superalloy, exposed microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode
10 μm
Link to full record for micrograph 734 Micrograph 734 : Ni-Superalloy, as-extruded microstructure
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Transmission electron microscopy (TEM) of carbon replica
20 μm

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