Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Contributor
Micrograph Library Browse the libraryAdvanced searchSystemsCompositionsTechniquesKeywordsPhase diagrams
HelpPreferencesAbout the micrograph libraryTerms of useContribute micrographs!FeedbackLinksCredits Print this page
micrograph index montage

Contributor

7 micrographs contributed by Lewis Lea, ordered by micrograph number.

Link to full record for micrograph 854 Micrograph 854 : Low Carbon Steel Grains, Copper Edge
System: Fe-C-X, Composition: Fe, C low (wt%)
Reflected light microscopy
500 μm
Link to full record for micrograph 855 Micrograph 855 : Low Carbon Steel
System: Fe-C-X, Composition: Fe, C low (wt%)
Scanning electron microscopy (SEM)
20 μm
Link to full record for micrograph 856 Micrograph 856 : Low Carbon Steel
System: Fe-C-X, Composition: Fe, C low (wt%)
Scanning electron microscopy (SEM)
5 μm
Link to full record for micrograph 858 Micrograph 858 : Bi 40wt%, Sn 60wt%
System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%)
Reflected light microscopy
100 μm
Link to full record for micrograph 859 Micrograph 859 : Bi 60wt%, Sn 40wt%
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Reflected light microscopy
100 μm
Link to full record for micrograph 860 Micrograph 860 : Bi 80wt%, Sn 20wt%
System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%)
Reflected light microscopy
100 μm
Link to full record for micrograph 871 Micrograph 871 : Low Carbon Steel
System: Fe-C-X, Composition: Fe, C 0.9 (wt%)
Atomic force microscopy (AFM)
30 μm

List all contributors