Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Keyword
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Keyword

4 micrographs for keyword cross section, ordered by micrograph number.

Link to full record for micrograph 124 Micrograph 124 : CMOS integrated circuit with Al wiring
System: Miscellaneous, Composition: Not specified
Focused ion beam (FIB) secondary electron image
20 μm
Link to full record for micrograph 125 Micrograph 125 : CMOS integrated circuit with Al wiring
System: Miscellaneous, Composition: Not specified
Focused ion beam (FIB) secondary electron image
2 μm
Link to full record for micrograph 126 Micrograph 126 : CMOS integrated circuit with Al wiring
System: Miscellaneous, Composition: Not specified
Focused ion beam (FIB) secondary electron image
15 μm
Link to full record for micrograph 128 Micrograph 128 : CMOS integrated circuit with Al wiring
System: Miscellaneous, Composition: Not specified
Focused ion beam (FIB) secondary electron image
4 μm

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