System
21 micrographs for system Ni-X, ordered by micrograph number.
Showing 11 - 20 of 21 micrographs | Page 1 2 3 | Previous | Next |
Micrograph
720
:
IN718 nickel-based superalloy held for 72 hours at 850°C System: Ni-X, Composition: Ni 53, Fe 19, Cr 18, Nb 5 (wt% approx) + small amounts of Ti, Mo, Co, Al Reflected light microscopy, cross-polarised, with Nomarski filter 25 μm |
|
Micrograph
721
:
Ni-Superalloy System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy) Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode 10 μm |
|
Micrograph
722
:
Ni-Superalloy System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy) Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode 6 μm |
|
Micrograph
723
:
Ni-Superalloy System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy) Transmission electron microscopy (TEM) 200 nm |
|
Micrograph
724
:
Ni-Superalloy, as-extruded microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
|
Micrograph
725
:
Ni-Superalloy, as-extruded microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
|
Micrograph
726
:
Ni-Superalloy, heat treated above gamma-prime solvus System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
|
Micrograph
727
:
Ni-Superalloy, heat treated above gamma-prime solvus System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode 100 nm |
|
Micrograph
728
:
Ni-Superalloy, heat treated above gamma-prime solvus System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
|
Micrograph
729
:
Ni-Superalloy, exposed microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
Showing 11 - 20 of 21 micrographs | Page 1 2 3 | Previous | Next |