Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Teaching & Learning Packages Atomic Force Microscopy

Atomic Force Microscopy

This teaching and learning package provides a brief introduction to atomic force microscopy (AFM), some of the ways it is commonly used and some of the problems faced.


The 3D rendering above shows gallium nitride islands grown on a sapphire substrate, imaged using atomic force microscopy

First created: August 2009. Converted to HTML5 February 2021.