Dissemination of IT for the Promotion of Materials Science (DoITPoMS)


Electromigration is an ever-increasing problem as integrated circuits are pushed towards further miniaturization. The theory of the phenomenon is explained, including electromigration-induced failure and how it has been and can be minimized.


Integrated circuits viewed under the scanning electron microscope

DoITPoMS standard terms of use

First created: June 2006. Converted to HTML5: November 2021.