Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

Electromigration

Electromigration is an ever-increasing problem as integrated circuits are pushed towards further miniaturization. The theory of the phenomenon is explained, including electromigration-induced failure and how it has been and can be minimized.

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Integrated circuits viewed under the scanning electron microscope

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First created: June 2006. Converted to HTML5: November 2021.