Dissemination of IT for the Promotion of Materials Science (DoITPoMS)


Going further

Books and Papers:

  • Reliability and Failure of Electronic Materials and Devices by Milton Ohring, Academic Press, San Diego, 1998.
    Provides a good overall explanation on the topic of electromigration
  • Review Article: Electromigration in integrated circuit conductors by J R Lloyd (J. Phys. D: Appl. Phys. 32 (1999) R109-R118).
    A good summary on electromigration in integrated circuit conductors
  • VLSI Technology by S.M. Sze (editor), Mc-Graw-Hill Book Company, New Jersey, 1988.
    Contains a good section on metallization and its choice of use for different materials



It contains a nice simple description of the electromigration process. Several other searches can be made within Wikipedia, the free encyclopedia, to look up technical terms.