Books and Papers:
- Reliability and Failure of Electronic Materials and Devices by Milton Ohring, Academic Press, San Diego, 1998.
Provides a good overall explanation on the topic of electromigration
- Review Article: Electromigration in integrated circuit conductors by J R Lloyd (J. Phys. D: Appl. Phys. 32 (1999) R109-R118).
A good summary on electromigration in integrated circuit conductors
- VLSI Technology by S.M. Sze (editor), Mc-Graw-Hill Book Company, New Jersey, 1988.
Contains a good section on metallization and its choice of use for different materials
It contains a nice simple description of the electromigration process. Several other searches can be made within Wikipedia, the free encyclopedia, to look up technical terms.